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- Carolyn Glazer-Hockstein and Alexander J Brucker.
- Scheie Eye Institute, Department of Ophthalmology, University of Pennsylvania, Philadelphia 19104, USA.
- Am. J. Ophthalmol. 2002 Jul 1; 134 (1): 142-3.
PurposeTo describe a simple technique that detects a subtle relative afferent pupillary defect.DesignObservational report.MethodsWith the patient seated at a slit lamp and the slit illumination turned off, a transilluminator light is swung back and forth between the eyes. The examiner observes the direct pupil light response and the consensual light response under slit-lamp magnification.ConclusionUsing slit-lamp magnification, the examiner may observe small amplitudes of pupillary movement in the evaluation of a relative afferent pupillary defect.
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